EEE-1111- Electrical Circuit I EEE-1112- Electrical Circuit I Sessional EEE-2111- Electronics Circuit I EEE-2112- Electronics Circuit I Sessional EEE-2324-Electrical Service Design EEE-4367- Measurement & Instrumentation EEE-4368- Measurement & Instrumentation Sessional EEE-3116- Digital Electronics Sessional EEE-4111- Microprocessor and Interfacing EEE-4112- Microprocessor and Interfacing Sessional EEE-4135- VLSI EEE-4136- VLSI Sessional TXE-207- Elements of Electrical Engineering TXE-208- Elements of Electrical Engineering Sessional

• Tariqul Islam, Johannes Zechner, Mirko Bernardoni, Michael Nelhiebel, and Reinhard Pippan., ‘’A novel setup for wafer curvature measurement at very high heating rates”, Review of Scientific Instruments, 88, 024709 (2017), (doi:10.1063/1.4975378) (https://doi.org/10.1063/1.4975378)

• Tariqul Islam, Johannes Zechner, Mirko Bernardoni, and Michael Nelhiebel, ‘’Strain rate influence on the thermo-mechanical deformation behaviour of aluminium thin films”, Nano-mechanical Testing in Materials Research and Development VI, 2017 (https://dc.engconfintl.org/nanomechtest_vi/90/)

• Tariqul Islam, Johannes Zechner, Mirko Bernardoni, and Michael Nelhiebel, ‘’Access to the thermo-mechanical deformation behaviour of thin films during ultra-fast pulsed heating”, 14th International Conference on Reliability and Stress-Related Phenomena in Nanoelectronics, 2016, Dresden, Germany

·          Won the 2nd best award for scientific contents

• Tariqul Islam, Johannes Zechner, Mirko Bernardoni, and Michael Nelhiebel, ‘’Access to the thermo-mechanical deformation behaviour of thin films during ultra-fast pulsed heating”, 14th International Conference on Reliability and Stress-Related Phenomena in Nanoelectronics, 2016, Dresden, Germany